MEASURING TABLE AND PROBES

4probes

View of the measuring table embedded in natural stone plate and four probes with 4”×4” silicon solar cell ready for measurement; both probes contacting backside of the cell as well as upper probes contacting cell’s bus bars are vacuum controlled;

 Brass measuring plate built-in polished black stone plate (photo included);

  1. Four independent vacuum controlled probes (photo included);
  2. Vacuum system for holding SC to measuring plate and changing position of probes;
  3. Pressurized air controlled multipin bar-type probes with thruster system 

 Gold-plated brass table with polished surface embedded in natural black stone serves as the back current probe. Two back-side voltage probes are located inside the table (electrically isolated from the table) and move up when the cell is vacuum-sucked to the table. Both voltage as well as current ‘soft touch’ telescopic probes are gold-plated and their movement is vacuum controlled either by digital signal from the computer or by pressing foot-pedal; four upper probes are independently positioned on the polished stone plate thus allowing the measurement of cells of any size and geometry of the front metallization. Special gasket made of very soft silicone rubber enables firm measurement of cells that are soldered or not perfectly even on the rear side. Measuring table can be either cooled or heated at temperature range 0÷60°C using a system of  the Peltier cells attached to its backside surface. Temperature of the table is measured automatically with accuracy ±0.2°C and is monitored during solar cell’s measurement using precise Pt100 thermo resistor located in the central area inside the brass table.

Please note! To measure any other than standard Si wafer-based cells special connector which can be directly connected to the Solar Cell I-V Curve Tracer can be provided on request.

MultipinProbes

Probing system where for control of multi-pin upper voltage/current probes pneumatic attenuator (thruster) was applied instead of vacuum controlled probes;